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CHAPTER 1 INTRODUCTION Section 1.1 Defining Characteristics of Technologies Section 1.2 Premise of the STEEP program and the XChips Section 1.3 Tunneling Device Introduction CHAPTER 2 TEST STRUCTURES AND METHODS EXPLORED Section 2.1 Individual Transistors Section 2.2 Ring Oscillator Section 2.3 Rapid Characterization of Threshold Variation Section 2.4 SRAM Bitcell Section 2.5 SRAM March Tests [...]
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Introduction Background NW C Program Developm ent General Development of Thermochemical Programs O rganization of R eport B asis O ptim ization Procedures for Determining Equilibrium Deletion of Condensed Phases Numerical Examples of Basis and Equilibrium Calculations The W ork of Sm ith and M issen N otes on the Propellant M odel Estimation ef [...]
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